IC Inspection

Established in as Taiwan IC Inspection manufacturer, supplier and factory. Our products supplied and exported worldwide relying on our professional talent and good experience. We force to manufacture products to suit the exact requirement of our client ranging from small business to huge manufacturing units. Custom-designs and OEM/ODM services are cordially welcome.
We wish to have sincere cooperation with all friends, and work together to create a more glorious tomorrow for common development. We also hope to receive precious ideas and suggestions from domestic and overseas' friends. Let us create good achievements in this

IC Inspection

and go out for a nice tomorrow together.
  • IC Inspection - 10-3,IC Flaw Inspection System
IC Inspection - 10-3,IC Flaw Inspection System IC Inspection - 10-3,IC Flaw Inspection System
IC Inspection
Model - 10-3,IC Flaw Inspection System
IC Flaw Inspection System

Abstract
Non-contact image capturing can be used for inspecting large volumes of chips at one time.

Introduction
IC chips are small in size, delicate in structure, and large in production; therefore, there are needs for accurate and efficient tools to assist in quality inspection. The Inspecting Solution for Defects of IC appearances is by using of a non-contact object scanner, exclusively designed by Microtek, to capture images of IC chips, effectively avoiding misjudgments caused by damaging of IC chips. The object scanner is capable to capture large-scale sizes of images and thus it can handle large volumes of chips fast at one time, shortening inspecting time effectively.
Using together with the MiQC-IC, a defect inspection and management system, a golden sample can be easily selected by an operator. Plus, advanced technology in use, the defective area can be found and marked precisely. After images with defects have been uploaded to the management system, users can find what they are looking for from tones of data quickly by using of file names, uploading dates or defect information, enhancing the management more effective and efficient.

Features
  • Non-contact capturing of images ensures the completeness of scanned objects
  • Capturing of a large-scale image enhances the work efficiency for large volumes of chips
  • Supports image scanning of various IC chips
  • Capable to select a golden sample manually; then, the system will mark positions for all chips and start defect comparisons automatically
  • Capable to perform Smart Search by using odd numbers, inspecting items, or point reading
  • Capable to set up defect categories and to perform a specific search by using defect items or uploading dates
  • Exclusively-designed inspection software can be set up to use on PC and web
AOI Brochure

Specifications
Scanning Area:             52 x 38 cm
Working Distance:       7 cm
Scanning Resolution:  20 μm
Image Sensor Type:     Color linear CCD
 
Microtek International, Inc.
10-3,IC Flaw Inspection System
none
999999999 http://schema.org/InStock USD 2020-12-31
90out of 100based on 100user ratings
Enquiry Now
Products List
Microtek International, Inc.
To find and shop the IC Inspection, you need to know about the highest quality of IC Inspection manufacturer, supplier, wholesaler, distributor from a factory in Taiwan
10-1,2D Barcode Inspection Solution
none
999999999 http://schema.org/InStock USD 2020-12-31
90out of 100based on 100user ratings
Microtek International, Inc.
To find and shop the IC Inspection, you need to know about the highest quality of IC Inspection manufacturer, supplier, wholesaler, distributor from a factory in Taiwan
10-2,Non-Woven Fabric Surface Defect Inspection Solution
none
999999999 http://schema.org/InStock USD 2020-12-31
90out of 100based on 100user ratings
Microtek International, Inc.
To find and shop the IC Inspection, you need to know about the highest quality of IC Inspection manufacturer, supplier, wholesaler, distributor from a factory in Taiwan
10-4,FAI-630
none
999999999 http://schema.org/InStock USD 2020-12-31
90out of 100based on 100user ratings